Jb. Simoes et al., DETERMINING THE EFFECTIVE NUMBER OF BITS OF HIGH-RESOLUTION DIGITIZERS, IEEE transactions on nuclear science, 44(3), 1997, pp. 407-410
A new testing method has been used to evaluate the dynamic performance
of several digitizing systems used in nuclear physics experiments. Th
is method is useful for characterizing high resolution analog to digit
al converters when a pure enough signal source is not available. The s
ignal to noise ratio of the digitizer, excluding the harmonic componen
ts from the noise, is the computed parameter. The use of this method t
o estimate jitter errors is also studied.