H. Pelletier et al., Behavior of hydrogen intentionally introduced by plasma into metalorganic vapor phase epitaxy grown CdTe : As layers, J APPL PHYS, 88(1), 2000, pp. 550-554
Arsenic doped CdTe layers have been successfully exposed to a hydrogen or d
euterium plasma to study the diffusion of these species and their interacti
ons with arsenic. It is shown that hydrogen behaves similarly when unintent
ionally (during growth) or intentionally (plasma exposure) introduced. Infr
ared absorption measurements show that in both cases, identical As-H comple
xes are formed. The IR absorption line of deuterium-arsenic complexes has a
lso been detected. The concentration of active arsenic acceptors decreases
after intentional hydrogen or deuterium diffusion, as a consequence of the
formation of these As-H or As-D complexes. But, the diffusion profiles of d
euterium show that deuterium in the semiconductor binds also to other As-re
lated centers which have not been identified unambiguously. (C) 2000 Americ
an Institute of Physics. [S0021-8979(00)09013-7].