DEPOSITION AND CHARACTERIZATION OF CDZNTE THIN-FILMS FOR GAS MICROSTRIP DETECTORS

Citation
R. Sudharsanan et al., DEPOSITION AND CHARACTERIZATION OF CDZNTE THIN-FILMS FOR GAS MICROSTRIP DETECTORS, IEEE transactions on nuclear science, 44(3), 1997, pp. 665-670
Citations number
16
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
44
Issue
3
Year of publication
1997
Part
1
Pages
665 - 670
Database
ISI
SICI code
0018-9499(1997)44:3<665:DACOCT>2.0.ZU;2-B
Abstract
Deposition, characterization, fabrication and performance of gas micro strip detectors (GMDs) using CdZnTe thin films to control surface resi stivity are reported. CdZnTe thin films deposited on glass or on flexi ble plastic substrates are attractive for GMDs since CdZnTe bulk resis tivity varies in the range 10(9) to 10(11) ohm-cm and CdZnTe films wit h good uniformity can be deposited over large areas using inexpensive deposition techniques. Metalorganic chemical vapor deposition was used to form CdZnTe thin films on glass and flexible plastic substrates. T he sheet resistance for 1 mu m thick CdZnTe film on glass varied in th e range 10 to 10(13) ohm/square depending on the growth conditions. GM Ds were fabricated using CdZnTe films deposited on glass substrates an d tested for energy response to Fe-55 X-rays. The well-resolved peaks (5.9 keV X-ray and 2.9 keV escape peak) clearly show the ability to su ccessfully fabricate CdZnTe thin films on GMDs.