The alignment systems required for the PHENIX muon tracking chamber sy
stem will be described. These systems include the system that has been
developed to accurately electro-etch cathode strip foils with respect
to external fiducial marks to a 25 mu m accuracy, as well as the syst
em that is being developed to measure the relative alignment of three
stations of chambers spanning 4.5 meters, to an accuracy of 25 mu m.