Vv. Nagarkar et al., CCD-BASED HIGH-RESOLUTION DIGITAL RADIOGRAPHY SYSTEM FOR NON DESTRUCTIVE EVALUATION, IEEE transactions on nuclear science, 44(3), 1997, pp. 885-889
Film radiography has long served the aerospace industry as a principal
method for hardware flaw detection. Although excellent in performance
, this method is extremely time consuming, labor intensive, costly, an
d is unsuitable for real time inspections. Modern digital radiographic
systems overcome some of these difficulties but are also limited in t
erms of speed of operation due to persistence of the sensor and a prob
lematic tradeoff between the X-ray detection efficiency and spatial re
solution. We are developing an innovative X-ray imaging detector consi
sting of a novel microstructured CsI scintillator coupled to a fiberop
tic taper-based CCD. Thin-film deposition techniques, previously devel
oped to produce thin, structured CsI screens have been extended to fab
ricate CsI screens, up to 450 mg/cm(2) (1,000 mu m) in thickness. Thes
e sensors are suitable to provide high detection efficiency with high
image quality for NDE applications. A prototype high energy imaging sy
stem was constructed by integrating these screens into a fiberoptic-ba
sed CCD camera. The performance was compared to that of the same syste
m using a standard polycrystalline phosphor for NDE imaging applicatio
ns. The experimental evaluations were carried out at Scientific Measur
ement Systems, Inc., Austin, TX.