S. Koster et al., Structural analysis of synthetic homo- and copolyesters by electrospray ionization on a Fourier transform ion cyclotron resonance mass spectrometer, J MASS SPEC, 35(6), 2000, pp. 739-748
The molecular structure of a series of homo- and copolyesters was studied u
sing sustained off-resonance irradiation collisionally activation dissociat
ion on a Fourier transform ion cyclotron resonance mass spectrometer. Elect
rospray ionization was used as an ionization technique. The most important
fragmentation pathways of the homopolyesters poly(dipropoxylated bisphenol-
A/adipic acid) and poly(dipropoxylated bisphenol-A/isophthalic acid) were s
tudied, Six different dissociation mechanisms were observed which are very
similar to the mechanisms found to occur during pyrolysis of these compound
s. Four of these mechanisms are a result of cleavages of the ester bond and
the others are due to cleavages of the ether bond or bisphenol-il unit. So
me of the fragments expected are not present in the spectrum, indicating th
at each fragment has a specific sodium affinity. Sequence-specific fragment
s of two of the three copolyester sequences that theoretically can exist we
re experimentally observed, Fragments that originate from the third sequenc
e are not unique and can also be formed from other sequences. Therefore, it
was not possible to determine the presence of the third sequence. Copyrigh
t (C) 2000 John Wiley & Sons, Ltd.