Structural analysis of synthetic homo- and copolyesters by electrospray ionization on a Fourier transform ion cyclotron resonance mass spectrometer

Citation
S. Koster et al., Structural analysis of synthetic homo- and copolyesters by electrospray ionization on a Fourier transform ion cyclotron resonance mass spectrometer, J MASS SPEC, 35(6), 2000, pp. 739-748
Citations number
53
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF MASS SPECTROMETRY
ISSN journal
10765174 → ACNP
Volume
35
Issue
6
Year of publication
2000
Pages
739 - 748
Database
ISI
SICI code
1076-5174(200006)35:6<739:SAOSHA>2.0.ZU;2-G
Abstract
The molecular structure of a series of homo- and copolyesters was studied u sing sustained off-resonance irradiation collisionally activation dissociat ion on a Fourier transform ion cyclotron resonance mass spectrometer. Elect rospray ionization was used as an ionization technique. The most important fragmentation pathways of the homopolyesters poly(dipropoxylated bisphenol- A/adipic acid) and poly(dipropoxylated bisphenol-A/isophthalic acid) were s tudied, Six different dissociation mechanisms were observed which are very similar to the mechanisms found to occur during pyrolysis of these compound s. Four of these mechanisms are a result of cleavages of the ester bond and the others are due to cleavages of the ether bond or bisphenol-il unit. So me of the fragments expected are not present in the spectrum, indicating th at each fragment has a specific sodium affinity. Sequence-specific fragment s of two of the three copolyester sequences that theoretically can exist we re experimentally observed, Fragments that originate from the third sequenc e are not unique and can also be formed from other sequences. Therefore, it was not possible to determine the presence of the third sequence. Copyrigh t (C) 2000 John Wiley & Sons, Ltd.