Characterization and nanometer-scale modifications of Bi2Te3 surface via atomic force microscopy

The structure of the basal plane of a Bi2Te3 crystal surface was studied by means of the atomic force microscopy (AFM) technique. The measured heights of steps, ranging from 0.2 to 1.4 nm, were in agreement with other structu ral data of Bi2Te3. The images of freshly cleaved surface, obtained with at omic resolution, revealed a plane of tellurium atoms. The recorded interato mic distances of 0.42+/-0.02 nm were also in accordance with the structural data. We also showed that there is a possibility of surface nanostructures formation using the AFM probe, when working above force threshold value. ( C) 2000 American Vacuum Society. [S0734-211X(00)13303-7].