Local atomic environment of Cu : CdTe thin film alloys

Citation
Jm. De Leon et al., Local atomic environment of Cu : CdTe thin film alloys, MICROELEC J, 31(6), 2000, pp. 429-431
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
31
Issue
6
Year of publication
2000
Pages
429 - 431
Database
ISI
SICI code
0026-2692(200006)31:6<429:LAEOC:>2.0.ZU;2-P
Abstract
We have used X-ray absorption spectroscopy of the K-edge of each element in a Cd0.85Cu0.15Te thin film to investigate the local atomic structure aroun d each constituent element. X-ray absorption near edge spectra reveal that the local electronic structure around Cd and Te atoms is similar to that of undoped CdTe, while that of Cu is different from that encountered in Cu me tal. X-ray absorption fine structure spectra show that while the Cd near ne ighbor environment is similar to that of undoped CdTe, the Te environment s hows differences compared with that found in undoped CdTe, consistent with Cu entering substitutionally for Cd. The Cu nearest neighbor environment su ggests the presence of Cu-metal ligands characteristic of Cu metal clusters . These results imply the occurrence of microscopic phase separation in thi s material in variance with X-ray diffraction results that show a single cr ystalline phase. (C) 2000 Elsevier Science Ltd. All rights reserved.