Trace analysis by heavy ion induced X-ray emission

Various K-, L- and M-shell X-ray production cross sections are measured for heavy ion impact on elements in the range Z(2) = 13 to 83. The ion species range from Z(1) = 10 to 36, and ion energies from 1 to 16 MeV are used. En hanced cross sections are observed when the projectile K- or L- binding ene rgy is similar to the energy of the target K-, L- or M-shell. This effect i s used to improve the analysis sensitivity for selected elements. As an exa mple trace analysis of Fe in glass with V, Mn, Co and Ni ions is investigat ed. Results are compared with proton induced X-ray emission analysis on the same samples. In these samples Fe-K-alpha X-ray production is similar for ii-radiation with 3 MeV protons and 14MeV Ni ions, However the signal to ba ckground ratio is four times higher for the irradiation with Ni ions as com pared to irradiation with protons. Advantages and dl drawbacks of heavy ion induced X-ray emission for quantitative analysis compared to proton induce d X-ray emission analysis an discussed.