Surface enhanced Raman spectroscopy on carbon filaments

Authors
Meyer, N Nestler, K Engisch, L Heilmann, A Marx, G
Citation
N. Meyer et al., Surface enhanced Raman spectroscopy on carbon filaments, MIKROCH ACT, 133(1-4), 2000, pp. 337-339
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
MIKROCHIMICA ACTA
ISSN journal
00263672 → ACNP
Volume
133
Issue
1-4
Year of publication
2000
Pages
337 - 339
Database
ISI
SICI code
0026-3672(2000)133:1-4<337:SERSOC>2.0.ZU;2-#
Abstract
A method for analysis of carbon-containing thin films by using surface enha nced Raman spectroscopy (SERS) is described. Thin films of boron nitride or silicon carbide which are deposited on carbon filaments were coated additi onally with silver nanoparticles. A very thin plasma polymer film was depos ited on the silver particles to give a better long time stability. Using th ese layers, very intensive carbon band were detected.