The optical parameters of GeTe semiconductor films after various thermal tr
eatments have been measured using a novel method. A comparative study using
a spectrum ellipsometer is presented. The optical parameters of the films
were extracted precisely by data analysis and corrections have been made to
previous calculations. Calculations based on the spectral ellipsometry mea
surements are presented finally, and the complex refractive index curves of
the samples in the spectral range from 250 to 830 nm have been obtained. (
C) 2000 Elsevier Science B.V. All rights reserved.