O. Renner et al., HIGH-LUMINOSITY, HIGH-RESOLUTION, X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMA BY VERTICAL-GEOMETRY JOHANN SPECTROMETER, Review of scientific instruments, 68(6), 1997, pp. 2393-2403
Successful applications of the vertical-geometry Johann spectrometer (
VJS) in advanced plasma spectroscopy are reported. Different experimen
tal configurations are discussed, and a complete quantitative analysis
of the spectrometer function including the transfer of the spectral l
ines is presented. The method for reconstruction of the spectra emitte
d from extended, quasilinear sources is described; the precision attai
nable and possible sources of errors are discussed. Due to the combina
tion of high collection efficiency, and spectral and one-dimensional s
patial resolution, the instrument is particularly suitable for high-pr
ecision measurements of the spectral line profiles and positions in no
nhomogeneous plasmas. The examples of experimental results, which are
superior to those obtained in earlier measurements, demonstrate the VJ
S performance and suggest a broad field of possible applications. (C)
1997 American Institute of Physics.