HIGH-LUMINOSITY, HIGH-RESOLUTION, X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMA BY VERTICAL-GEOMETRY JOHANN SPECTROMETER

Citation
O. Renner et al., HIGH-LUMINOSITY, HIGH-RESOLUTION, X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMA BY VERTICAL-GEOMETRY JOHANN SPECTROMETER, Review of scientific instruments, 68(6), 1997, pp. 2393-2403
Citations number
22
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
68
Issue
6
Year of publication
1997
Pages
2393 - 2403
Database
ISI
SICI code
0034-6748(1997)68:6<2393:HHXSOL>2.0.ZU;2-Y
Abstract
Successful applications of the vertical-geometry Johann spectrometer ( VJS) in advanced plasma spectroscopy are reported. Different experimen tal configurations are discussed, and a complete quantitative analysis of the spectrometer function including the transfer of the spectral l ines is presented. The method for reconstruction of the spectra emitte d from extended, quasilinear sources is described; the precision attai nable and possible sources of errors are discussed. Due to the combina tion of high collection efficiency, and spectral and one-dimensional s patial resolution, the instrument is particularly suitable for high-pr ecision measurements of the spectral line profiles and positions in no nhomogeneous plasmas. The examples of experimental results, which are superior to those obtained in earlier measurements, demonstrate the VJ S performance and suggest a broad field of possible applications. (C) 1997 American Institute of Physics.