Neutron diffraction evidence of microscopic charge inhomogeneities in the CuO2 plane of superconducting La2-xSrxCuO4 (0 <= x <= 0.30)

Citation
Es. Bozin et al., Neutron diffraction evidence of microscopic charge inhomogeneities in the CuO2 plane of superconducting La2-xSrxCuO4 (0 <= x <= 0.30), PHYS REV L, 84(25), 2000, pp. 5856-5859
Citations number
21
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
25
Year of publication
2000
Pages
5856 - 5859
Database
ISI
SICI code
0031-9007(20000619)84:25<5856:NDEOMC>2.0.ZU;2-D
Abstract
High-resolution atomic pair distribution functions have been obtained using neutron powder diffraction data from La2-xSrxCuO4 over the range of doping 0 less than or equal to x less than or equal to 0.30 at 10 K. Despite the average structure getting less orthorhombic, we see a broadening of thr in- plane Cu-O bond distribution as a function of doping up to optimal doping. Thereafter the peak abruptly sharpens. The peak broadening can be well expl ained by a local microscopic coexistence of doped and undoped material. Thi s suggests a crossover from a charge inhomogeneous state at and below optim al doping to a homogeneous charge stale above optimal doping.