Elimination of boron memory effect in inductively coupled plasma-mass spectrometry by ammonia gas injection into the spray chamber during analysis

Citation
As. Al-ammar et al., Elimination of boron memory effect in inductively coupled plasma-mass spectrometry by ammonia gas injection into the spray chamber during analysis, SPECT ACT B, 55(6), 2000, pp. 629-635
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
ISSN journal
05848547 → ACNP
Volume
55
Issue
6
Year of publication
2000
Pages
629 - 635
Database
ISI
SICI code
0584-8547(20000609)55:6<629:EOBMEI>2.0.ZU;2-R
Abstract
Injection of 10-20 ml/min of ammonia gas into an inductively coupled plasma -mass spectrometry (ICP-MS) spray chamber during boron determination elimin ates the memory effect of a 1 mu g/ml B solution within a 2-min washing tim e. Ammonia gas injection also reduces the boron blank by a factor of four a nd enhances the sensitivity by 33-90%. Boron detection limits are improved from 12 and 14 to 3 and 4 ng/ml, respectively, for mio ICP-MS instruments. Trace boron concentrations in certified reference materials agree well usin g ammonia gas injection. (C) 2000 Elsevier Science B.V. All rights reserved .