Scanning tunneling microscopy evidence of a special bonding of Cu adatoms on Si(111)-root 3 x root 3-Ag surface - Direct observation of surface-stateelectron migration (vol 446, pg 120, 2000)

Authors
Tong, X Shiokawa, T Hammura, K Aoyagi, Y
Citation
X. Tong et al., Scanning tunneling microscopy evidence of a special bonding of Cu adatoms on Si(111)-root 3 x root 3-Ag surface - Direct observation of surface-stateelectron migration (vol 446, pg 120, 2000), SURF SCI, 457(1-2), 2000, pp. 294-294
Citations number
1
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
457
Issue
1-2
Year of publication
2000
Pages
294 - 294
Database
ISI
SICI code
0039-6028(20000601)457:1-2<294:STMEOA>2.0.ZU;2-8