Effect of charge carriers on the barrier height for vacancy formation on InP(110) surfaces

Citation
U. Semmler et al., Effect of charge carriers on the barrier height for vacancy formation on InP(110) surfaces, APPL PHYS L, 77(1), 2000, pp. 61-63
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
1
Year of publication
2000
Pages
61 - 63
Database
ISI
SICI code
0003-6951(20000703)77:1<61:EOCCOT>2.0.ZU;2-4
Abstract
We determine the energy barrier height for the formation of positively char ged phosphorus vacancies in InP(110) surfaces using the rate of formation o f vacancies measured directly from scanning tunneling microscope images. We found a barrier height in the range of 1.15-1.21 eV. The barrier height de creases with increasing carrier concentration. These results are explained by a charge separation during the vacancy formation process. (C) 2000 Ameri can Institute of Physics. [S0003-6951(00)02027-1].