Backward diodes are a version of Esaki tunnel diodes that are useful for mi
xing and detection. Ge backward diodes in particular have been used as temp
erature insensitive, zero bias square law detectors, capable of translating
low level rf power into de voltage or current with extreme linearity and l
ow noise. However, Ge diodes are difficult to reproducibly manufacture and
are physically fragile. Here we demonstrate specially designed Sb-heterostr
ucture-based backward diodes grown by molecular beam epitaxy. These diodes
have superior figures of merit compared to Ge diodes, especially the curren
t density and junction resistance, and are reproducible and physically rugg
ed. In addition, the flexibility of MBE growth allows easy tailoring of the
layer structure to maximize the desired figure of merit for a given applic
ation.