Sb-heterostructure interband backward diodes

Citation
Jn. Schulman et Dh. Chow, Sb-heterostructure interband backward diodes, IEEE ELEC D, 21(7), 2000, pp. 353-355
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
21
Issue
7
Year of publication
2000
Pages
353 - 355
Database
ISI
SICI code
0741-3106(200007)21:7<353:SIBD>2.0.ZU;2-G
Abstract
Backward diodes are a version of Esaki tunnel diodes that are useful for mi xing and detection. Ge backward diodes in particular have been used as temp erature insensitive, zero bias square law detectors, capable of translating low level rf power into de voltage or current with extreme linearity and l ow noise. However, Ge diodes are difficult to reproducibly manufacture and are physically fragile. Here we demonstrate specially designed Sb-heterostr ucture-based backward diodes grown by molecular beam epitaxy. These diodes have superior figures of merit compared to Ge diodes, especially the curren t density and junction resistance, and are reproducible and physically rugg ed. In addition, the flexibility of MBE growth allows easy tailoring of the layer structure to maximize the desired figure of merit for a given applic ation.