Substrate crosstalk suppression capability of silicon-on-insulator substrates with buried ground planes (GPSOI)

Citation
Js. Hamel et al., Substrate crosstalk suppression capability of silicon-on-insulator substrates with buried ground planes (GPSOI), IEEE MICR G, 10(4), 2000, pp. 134-135
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE MICROWAVE AND GUIDED WAVE LETTERS
ISSN journal
10518207 → ACNP
Volume
10
Issue
4
Year of publication
2000
Pages
134 - 135
Database
ISI
SICI code
1051-8207(200004)10:4<134:SCSCOS>2.0.ZU;2-B
Abstract
Experimental s(21) transmission crosstalk studies have been conducted on si licon-on-insulator substrates with buried ground planes (GPSOI's) where a 2 Omega per square metal-silicide buried ground plane existed between a 15 O mega-cm p-type silicon substrate and a 1 mu m thick buried CVD oxide layer. Locally grounded transmission test structures fabricated on GPSOI were fou nd to exhibit 20 dB increased crosstalk suppression compared to published d ata for high resistivity (200 Omega-cm) SOI substrates incorporating capaci tive guard rings over a frequency range from 500 MHz to 50 GHz, This repres ents an order of magnitude improvement in crosstalk power suppression capab ility compared to existing state-of-the-art suppression techniques in silic on substrates.