High-isolation CPW MEMS shunt switches - Part 2: Design

Citation
Jb. Muldavin et Gm. Rebeiz, High-isolation CPW MEMS shunt switches - Part 2: Design, IEEE MICR T, 48(6), 2000, pp. 1053-1056
Citations number
3
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
48
Issue
6
Year of publication
2000
Pages
1053 - 1056
Database
ISI
SICI code
0018-9480(200006)48:6<1053:HCMSS->2.0.ZU;2-J
Abstract
In this paper, the second of two parts, the equivalent RLC model of the shu nt switch is used in the design of tuned two- and four-bridge "cross" switc hes from 10 to 40 GHz, The cross switch attained an insertion loss of less than 0.3-0.6 dB, a return loss below -20 dB from 22 to 38 GHz in the up sta te, and a down-state isolation of 45-50 dB with only 1.5 pF of down-state c apacitance (Cd) Also, an X-band microelectromechanical system (MEMS) switch with an insertion loss of less than 0.2 dB and an isolation of 35 dB is pr esented. This is done by inductively tuning the LC series resonance of the shunt switch. The MEMS bridge height is 1.5-2.5 mu m, resulting in a pull-d own voltage of 15-25 V. Application areas are in low-loss high-isolation co mmunication and radar switches.