(Mn, Sb) doped Pb(Zr, Ti)O-3 (PMSZT) thin film infrared (IR) detectors were
integrated with Si substrates. The epitaxial PMSZT thin films, deposited o
n c-axis oriented YBa2Cu3O7-y (YBCO) bottom electrodes, show good ferroelec
tric properties with a remnant polarization P-r of 31 mu C/cm(2), a spontan
eous polarization P-s of 38 mu C/cm(2), and a coercive field E-c of 21 kV/c
m under an electric field of 76 kV/cm. Doping with Mn and Sb into Pb(Zr, Ti
)O-3 (PZT) not only decreased the Curie temperature T-C from 350 degrees C
for PZT to 175 degrees C for PMSZT, but also enhanced IR responsivity signi
ficantly. PMSZT thin films show high figures of merit, F-i of 15.5 x 10(-9)
C cm/J, F-v of 1758 cm(2)/C and F-d of 5 x 10(-5) Pa-1/2 at 25 degrees C.
IR detector arrays, fabricated with PMSZT films deposited on YBCO microbrid
ges with an air gap between them and the substrate for reduced thermal mass
, show a higher IR voltage responsivity compared to those without an air ga
p. (C) 2000 American Institute of Physics. [S0021-8979(00)00911-7].