J. Kunde et al., Sensitive characterization of phase and amplitude semiconductor nonlinearities for broadband 20 fs excitation, J APPL PHYS, 88(2), 2000, pp. 1187-1189
We present an experimental technique that allows for the detection of pump-
induced transmission and phase changes with high sensitivity and ultrafast
temporal resolution over an arbitrarily wide time window. This is achieved
combining spectral interferometry with high-frequency-chopping differential
transmission measurements. With this setup, exciton and continuum nonlinea
rities in a semiconductor are studied for broadband excitation. We find tha
t the pump-induced phase changes at the exciton and in the continuum decay
on distinctly different time scales, indicating different microscopic origi
ns. (C) 2000 American Institute of Physics. [S0021-8979(00)04514-X].