Sensitive characterization of phase and amplitude semiconductor nonlinearities for broadband 20 fs excitation

Citation
J. Kunde et al., Sensitive characterization of phase and amplitude semiconductor nonlinearities for broadband 20 fs excitation, J APPL PHYS, 88(2), 2000, pp. 1187-1189
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
2
Year of publication
2000
Pages
1187 - 1189
Database
ISI
SICI code
0021-8979(20000715)88:2<1187:SCOPAA>2.0.ZU;2-N
Abstract
We present an experimental technique that allows for the detection of pump- induced transmission and phase changes with high sensitivity and ultrafast temporal resolution over an arbitrarily wide time window. This is achieved combining spectral interferometry with high-frequency-chopping differential transmission measurements. With this setup, exciton and continuum nonlinea rities in a semiconductor are studied for broadband excitation. We find tha t the pump-induced phase changes at the exciton and in the continuum decay on distinctly different time scales, indicating different microscopic origi ns. (C) 2000 American Institute of Physics. [S0021-8979(00)04514-X].