SiFe specimens prepared from GO steel with different surface treatments wer
e studied from the point of view of structure, stresses and defect density
using the conversion electron Mossbauer syectroscopy (CEMS) and the slow po
sitron annihilation spectroscopy (SPAS). Amounts of the high defect density
(HDD) phase and defect depth profiles were obtained for specimens after me
chanical and/or chemical surface polishing. (C) 2000 Elsevier Science B.V.
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