Anisotropic electrolyte electroreflectance study of rhenium-doped MoS2

Citation
Kk. Tiong et Ts. Shou, Anisotropic electrolyte electroreflectance study of rhenium-doped MoS2, J PHYS-COND, 12(23), 2000, pp. 5043-5052
Citations number
36
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
12
Issue
23
Year of publication
2000
Pages
5043 - 5052
Database
ISI
SICI code
0953-8984(20000612)12:23<5043:AEESOR>2.0.ZU;2-3
Abstract
Anisotropy of rhenium-doped MoS2 parallel and perpendicular to the c-axis ( k parallel to c and k perpendicular to c) was studied using electrolyte ele ctroreflectance (EER) measurements over an energy range from 1.75 eV to 4.5 eV. The measurements for k perpendicular to c were made possible by the th icker samples of MoS2 available through introducing a small concentration o f rhenium during growth. The excitonic transitions A and B for both k perpe ndicular to c and k parallel to c configurations showed different degrees o f red shift compared with that of the undoped sample. It is found that rhen ium which is present as an intentionally doped impurity plays an important role in affecting the observed differences.