Exact solution of the electrostatic problem for a single-electron dual-junction-array trap

Citation
Jy. Ryu et al., Exact solution of the electrostatic problem for a single-electron dual-junction-array trap, J PHYS-COND, 12(21), 2000, pp. 4641-4653
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
12
Issue
21
Year of publication
2000
Pages
4641 - 4653
Database
ISI
SICI code
0953-8984(20000529)12:21<4641:ESOTEP>2.0.ZU;2-K
Abstract
We present an exact analytical solution to the electrostatic problem of the biased single-electron dual-junction-array trap, which consists of equal s tray capacitances C-0, equal junction capacitances C, equal input gate capa citances C-1, and a coupling capacitance C-C. The threshold voltages are in vestigated for various charge solitons including a single electron, an exci ton, and a combined exciton and single electron. Our results show that thei r threshold voltages have strong dependences on the cotunnelling, C-0/C, C- 1/C, C-C/C, and the number of junctions, and that various types of charge s oliton transport occur according to these parameters. Previous discussions in the literature have neglected the effect of the stray capacitance, but w e find that the effect plays an important role in the charge soliton transp ort.