A novel application of silicon microstrip technology for energy-dispersiveEXAFS studies

Authors
Iles, G Dent, A Derbyshire, G Farrow, R Hall, G Noyes, G Raymond, M Salvini, G Seller, P Smith, M Thomas, S
Citation
G. Iles et al., A novel application of silicon microstrip technology for energy-dispersiveEXAFS studies, J SYNCHROTR, 7, 2000, pp. 221-228
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF SYNCHROTRON RADIATION
ISSN journal
09090495 → ACNP
Volume
7
Year of publication
2000
Part
4
Pages
221 - 228
Database
ISI
SICI code
0909-0495(200007)7:<221:ANAOSM>2.0.ZU;2-Z
Abstract
A prototype X-ray detector for energy-dispersive EXAFS has been developed a nd tested to demonstrate the principle of using silicon microstrip detector technology for this application. Testing took place at the UK Synchrotron Radiation Source, where the absorption spectra of a 5 mu m Ni foil and a 25 mM NiCl2 solution were obtained.