Extraction of accurate structure-factor amplitudes from Laue data: wavelength normalization with wiggler and undulator X-ray sources

Wavelength normalization is an essential part of processing of Laue X-ray d iffraction data and is critically important for deriving accurate structure -factor amplitudes. The results of wavelength normalization for Laue data o btained in nanosecond time-resolved experiments at the ID09 beamline at the European Synchrotron Radiation Facility, Grenoble, France, are presented. Several wiggler and undulator insertion devices with complex spectra were u sed. The results show that even in the most challenging cases, such as wigg ler/undulator tandems or single-line undulators, accurate wavelength normal ization does not require unusually redundant Laue data and can be accomplis hed using typical Laue data sets. Single-line undulator spectra derived fro m Laue data compare well with the measured incident X-ray spectra. Successf ul wavelength normalization of the undulator data was also confirmed by the observed signal in nanosecond time-resolved experiments. Single-line undul ators, which are attractive for time-resolved experiments due to their high peak intensity and low polychromatic background, are compared with wiggler s, based on data obtained on the same crystal.