Charge carrier transport via defect states in Cu(In, Ga)Se-2 thin films and Cu(In, Ga)Se-2/CdS/ZnO heterojunctions

Citation
M. Schmitt et al., Charge carrier transport via defect states in Cu(In, Ga)Se-2 thin films and Cu(In, Ga)Se-2/CdS/ZnO heterojunctions, PHYS REV B, 61(23), 2000, pp. 16052-16059
Citations number
39
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
61
Issue
23
Year of publication
2000
Pages
16052 - 16059
Database
ISI
SICI code
0163-1829(20000615)61:23<16052:CCTVDS>2.0.ZU;2-I
Abstract
We present results of static and dynamic electrical conductance experiments on Cu(In, Ga)Se-2 thin films and Cu(In, Ga)Se-2/CdS/ZnO heterojunction sol ar cells prepared by rapid thermal processing. For the static conductance, we find a temperature dependence of the conductance according to Mott's var iable range hopping model. For the dynamic conductance at temperatures belo w 30 K, we find a power-law frequency dependence over nearly five decades w ith an exponent of about 0.87. The temperature dependence of the dynamic co nductance is found to be linear. Thus, the conductance in the static limit and the dynamic conductance point to tunneling between localized states as the dominant charge-carrier transport mechanism at low temperatures. In add ition, both methods applied provide an independent determination of the den sity-of-defect states at the Fermi level. We further observe a metastabilit y of the kind that in an illuminated state the conductance and the density- of-states are higher than they are in an annealed state. We can reversibly switch between these states by illuminating and annealing subsequently.