Elliptical x-ray microprobe mirrors by differential deposition

Citation
Ge. Ice et al., Elliptical x-ray microprobe mirrors by differential deposition, REV SCI INS, 71(7), 2000, pp. 2635-2639
Citations number
13
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
7
Year of publication
2000
Pages
2635 - 2639
Database
ISI
SICI code
0034-6748(200007)71:7<2635:EXMMBD>2.0.ZU;2-7
Abstract
A differential coating method is described for fabricating high-performance x-ray microfocusing mirrors. With this method, the figure of ultrasmooth s pherical mirrors can be modified to produce elliptical surfaces with low ro ughness and low figure errors. Submicron focusing is demonstrated with prot otype mirrors. The differential deposition method creates stiff monolithic mirrors which are compact, robust, and easy to cool and align. Prototype mi rrors have demonstrated gains of more than 10(4) in beam intensity while ma intaining submilliradian divergence on the sample. This method of producing elliptical mirrors is well matched to the requirements of an x-ray microdi ffraction Kirkpatrick-Baez focusing system. (C) 2000 American Institute of Physics. [S0034-6748(00)01607-5].