T. Roder et al., Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection, REV SCI INS, 71(7), 2000, pp. 2759-2764
We report results obtained with a scanning near-field optical microscope wh
ich was developed, recently. The scanning head of the device is mounted on
an inverted polarizing microscope. The sample is illuminated through a micr
ofabricated tip which is mounted on a single-mode optical wave-guiding fibe
r. The light transmitted through the sample is collected in the far field b
y a microscope lens. The distance between the tip and the sample is control
led by shear force detection, using a nonconventional setup. We applied thi
s new equipment successfully in order to investigate birefringent and dichr
oic liquid crystal films, using polarization modulation or fluorescence det
ection, respectively. An optical resolution down to approximate to 200 nm w
as obtained on the sample of a cholesteric liquid crystal for a wavelength
of 488 nm. (C) 2000 American Institute of Physics. [S0034-6748(00)04507-X].