Distribution of dangling bond pairs on partially hydrogen-terminated Si(100) surface observed by scanning tunneling microscopy

Authors
Citation
Rp. Chen et Ds. Lin, Distribution of dangling bond pairs on partially hydrogen-terminated Si(100) surface observed by scanning tunneling microscopy, SURF SCI, 454, 2000, pp. 196-200
Citations number
14
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
454
Year of publication
2000
Pages
196 - 200
Database
ISI
SICI code
0039-6028(20000520)454:<196:DODBPO>2.0.ZU;2-O
Abstract
Hydrogen recombinative desorption from a Si2H2 monohydride dimer on the Si( 100) surface regenerates a dangling bond (DB) pair on the dimer. In this pa per, we investigated the spatial distribution of the regenerated DB pairs o n the Si(100)-2 x 1:H and disilane-passivated Si(100) surface using elevate d temperature scanning tunneling microscopy (HT-STM) in the temperature ran ge between 590 and 622 K. Experimental results indicate that the ends of on e-dimensional (1D) monohydride dimer islands are preferred sites for DB pai rs and a repulsive interaction occurs between two neighboring DB pairs in t he same dimer row. (C) 2000 Elsevier Science B.V. All rights reserved.