Field ion microscopy (FIM) was used to study the reaction of nitric oxide (
NO) with silver (Ag) field emitter tips. The clean and almost hemispherical
shape of the Ag tip apex was found to undergo restructuring during field-f
ree interaction with 150 L NO (1 L=1.3 x 10(-4) Pa.s) at 400 K. Imaging at
57 K revealed an enlarged central (111) pole and a smaller number of layers
leading to peripheral planes. Thus, crystal coarsening occurred during rea
ction with NO gas. Moreover, planes lying along the [100] zone lines appear
ed dark and could only be recovered by field evaporation of a large number
of surface layers. Areas of the former {012} planes appeared enlarged. Thes
e structural changes are interpreted as being caused by oxygen atoms releas
ed during NO decomposition. Cleaning the oxygen-covered tip by field evapor
ation and heating it to 400 K reproduced this reconstruction form. This fin
ding is explained by the formation of subsurface oxygen and its resegregati
on to the surface. However, if the sample, either clean or oxygen-covered,
was sputter-cleaned and subsequently heated to 400 K, only slight changes o
f the surface structure were found. These changes involved increased local
disorder and somewhat enlarged low-index planes as compared to the field-ev
aporated clean Ag specimen. (C) 2000 Elsevier Science B.V. All rights reser
ved.