Temperature study of phase coexistence in the system Pb on an Si(111) surface

Citation
J. Slezak et al., Temperature study of phase coexistence in the system Pb on an Si(111) surface, SURF SCI, 454, 2000, pp. 584-590
Citations number
15
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
454
Year of publication
2000
Pages
584 - 590
Database
ISI
SICI code
0039-6028(20000520)454:<584:TSOPCI>2.0.ZU;2-C
Abstract
The temperature-dependent coexistence of Si0.28Pb0.72/Si(111) and Si(111)-( 1 x 1)-Pb phases was investigated using scanning tunneling microscopy. An a rea of (1 x 1)-Pb islands was monitored as a function of temperature rangin g from room temperature up to 400 degrees C. The movie strategy was applied in order to acquire successive images of a selected region. It was found t hat this area fluctuates quasi-periodically in time, with amplitude dependi ng on temperature. The strongest fluctuations (up to 10% of the mean area v alue) were observed at 210 degrees C. These fluctuations were restricted to the defect-free parts of the island perimeter, the rest of the (1 x 1)-Pb phase being stable. A further increase in temperature lead to a monotonous temperature-dependent decrease in (1 x 1)-Pb areas. This decrease was obser ved to be strongly tip-influenced at temperatures slightly above 210 degree s C, while at higher temperatures the desorption of Pb atoms prevailed. (C) 2000 Elsevier Science B.V. All rights reserved.