Extended X-ray absorption fine structure investigation of the structure ofiron overlayers on Cu(111)

Citation
Mt. Butterfield et Md. Crapper, Extended X-ray absorption fine structure investigation of the structure ofiron overlayers on Cu(111), SURF SCI, 454, 2000, pp. 719-722
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
454
Year of publication
2000
Pages
719 - 722
Database
ISI
SICI code
0039-6028(20000520)454:<719:EXAFSI>2.0.ZU;2-H
Abstract
Surface extended X-ray absorption fine structure (SEXAFS) has been used to probe the structure of ultrathin films of iron on Cu(111), With increasing film thickness, the interatomic separation falls from 2.57 Angstrom rapidly towards that of bulk iron (2.48 Angstrom). The degree of order and coordin ation in the films also fall over this region. These changes are consistent with a loss of face-centred cubic structure. However, the structure does n ot exhibit a clear body-centred cubic SEXAFS fingerprint until around eight layers. (C) 2000 Elsevier Science B.V. All rights reserved.