Study of the Ge(111)/GeO2 interface by optical second harmonic spectroscopy

Citation
H. Ohashi et al., Study of the Ge(111)/GeO2 interface by optical second harmonic spectroscopy, SURF SCI, 454, 2000, pp. 1069-1073
Citations number
16
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
454
Year of publication
2000
Pages
1069 - 1073
Database
ISI
SICI code
0039-6028(20000520)454:<1069:SOTGIB>2.0.ZU;2-D
Abstract
The reflected optical second harmonic intensity from the Ge(111)/GeO2 inter face has been measured in a dry nitrogen atmosphere as a function of the in cident photon energy. The oxide layer was produced by thermally oxidizing a Ge(111) substrate in pule oxygen gas at 823 K. We have found that the SH i ntensity pattern as a function of the sample rotation angle around the surf ace normal changes drastically in the photon energy range near h omega =1.1 7 eV in the p-polarized input and p-polarized output configuration. At this resonance, the anisotropic SH response from the interface has a dominant c ontribution to the SH intensity. (C) 2000 Elsevier Science B.V. All rights reserved.