Measuring earthquakes from optical satellite images

Citation
N. Van Puymbroeck et al., Measuring earthquakes from optical satellite images, APPL OPTICS, 39(20), 2000, pp. 3486-3494
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
20
Year of publication
2000
Pages
3486 - 3494
Database
ISI
SICI code
0003-6935(20000710)39:20<3486:MEFOSI>2.0.ZU;2-Q
Abstract
Systeme pour l'Observation de la Terre images are used to map ground displa cements induced by earthquakes. Deformations (offsets) induced by stereosco pic effect and roll, pitch, and yaw of satellite and detector artifacts are estimated and compensated. Images are then resampled in a cartographic pro jection with a low-bias interpolator. A subpixel correlator in the Fourier domain provides two-dimensional offset maps with independent measurements a pproximately every 160 m. Biases on offsets are compensated from calibratio n. High-frequency noise (0.125 m(-1)) is similar to 0.01 pixels. Low-freque ncy noise (lower than 0.001 m(-1)) exceeds 0.2 pixels and is partially comp ensated from modeling. Applied to the Landers earthquake, measurements show the fault with an accuracy of a few tens of meters and yields displacement on the fault with an accuracy of better than 20 cm. Comparison with a mode l derived from geodetic data shows that offsets bring new insights into the faulting process. (C) 2000 Optical Society of America. OCIS codes: 100.010 0, 100.2000, 100.6640, 100.2960, 280.0280.