In-process monitoring of grinding and polishing of optical surfaces

Citation
Rjm. Van Der Bijl et al., In-process monitoring of grinding and polishing of optical surfaces, APPL OPTICS, 39(19), 2000, pp. 3300-3303
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
19
Year of publication
2000
Pages
3300 - 3303
Database
ISI
SICI code
0003-6935(20000701)39:19<3300:IMOGAP>2.0.ZU;2-L
Abstract
A new tool with which to monitor the quality (roughness and subsurface dama ge) of optical surfaces during grinding and polishing, intensity-detecting total internal reflection microscopy (iTIRM), is presented. A general descr iption of the new measurement method is given, followed by a description of the experimental in situ measurement setup. Experimental results of the me thod are presented that demonstrate that iTIRM can be used either to contro l the roughness-reduction process during production or to investigate the p rocess itself. The possibility of implementing the method in an optical wor kshop is discussed. (C) 2000 Optical Society of America. OCIS codes: 120.42 90, 120.6660, 220.4610, 220.4840, 220.5450.