Second-harmonic spectroscopy of bulk boron-doped Si(001)

Citation
D. Lim et al., Second-harmonic spectroscopy of bulk boron-doped Si(001), APPL PHYS L, 77(2), 2000, pp. 181-183
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
2
Year of publication
2000
Pages
181 - 183
Database
ISI
SICI code
0003-6951(20000710)77:2<181:SSOBBS>2.0.ZU;2-2
Abstract
The effect of bulk boron incorporation on the second-harmonic generation (S HG) spectrum of Si(001) films grown epitaxially by chemical vapor depositio n is studied as a function of doping level and temperature. At room tempera ture, boron doping (N-A similar to 10(18) cm(-3)) strongly enhances and blu eshifts the E-1 resonance of the second-harmonic generation spectra to 3.4 eV. Surface hydrogen termination reverses this effect. The observed doping and temperature dependence are modeled as electric-field-induced SHG in the bulk depletion region. The results suggest applications of SHG as an in si tu, noninvasive probe of electrically active dopants. (C) 2000 American Ins titute of Physics. [S0003-6951(00)04828-2].