Core-level photoemission study of the Bi-GaAs(111) A interface

Citation
C. Mcginley et al., Core-level photoemission study of the Bi-GaAs(111) A interface, APPL SURF S, 158(3-4), 2000, pp. 292-300
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
158
Issue
3-4
Year of publication
2000
Pages
292 - 300
Database
ISI
SICI code
0169-4332(200005)158:3-4<292:CPSOTB>2.0.ZU;2-V
Abstract
Core-level photoemission spectra of the As 3d, Ga 3d and Bi 5d core levels were recorded for the Bi-GaAs (111)A-(2 X 2) surface. From the early stages of Bi growth, there are two distinct chemical environments for Bi. Surface Bi is bonded to both As and Ga atoms. The deposition of approximately 1 ML of Bi removes the dangling bonds from the surface As and Ga atoms, which a re associated with the (2 X 2) vacancy-buckling structure. Annealing to 350 degrees C reverses this process and surface dangling bonds for Ga reappear . When the Bi had fully desorbed at 425 degrees C, photoemission and LEED r esults showed that the surface recovers the (2 X 2) vacancy structure but w ith a larger degree of surface disorder than that found before the depositi on of Bi. (C) 2000 Elsevier Science B.V. All rights reserved.