An atomic force microscopy study of asphaltenes on mica surfaces. Influence of added resins and demulsifiers

Citation
Mh. Ese et al., An atomic force microscopy study of asphaltenes on mica surfaces. Influence of added resins and demulsifiers, COLLOID P S, 278(6), 2000, pp. 532-538
Citations number
25
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
COLLOID AND POLYMER SCIENCE
ISSN journal
0303402X → ACNP
Volume
278
Issue
6
Year of publication
2000
Pages
532 - 538
Database
ISI
SICI code
0303-402X(200006)278:6<532:AAFMSO>2.0.ZU;2-3
Abstract
Monolayers of asphaltene and resins on the water surface have been transfer red at a surface pressure of 10 mN/m onto mica substrates using the Langmui r-Blodgett technique. Atomic force microscopy (AFM) has been used to examin e the topography of these layers. Monolayers consisting of pure asphaltene fractions provide a rigid him with a close-packed structure, while the resi ns build up a continuous open network. Mixed films of these two fractions s how that a gradual increase in resin concentration leads to an opening of t he rigid asphaltene structure towards a more resin like configuration. Incr eased aggregation when the two heavy functions are present in one film is s een as larger individual units in the AFM pictures. Addition of high-molecu lar-weight demulsifiers/inhibitors results in the same kind of influence on the asphaltene film as seen with the resins.