The transport properties of GaAs/AlGaAs submicron rings with split gates in
the conditions corresponding to the ring resistance R-SD > h/e(2) are stud
ied. Oscillations of R-SD as a function of the gate voltage V-G are experim
entally observed. The oscillations are caused by the single-electron chargi
ng of two triangular conducting regions into which the ring is divided in t
he tunneling regime. (C) 2000 MAIK "Nauka/Interperiodica".