Force calibration in lateral force microscopy

Citation
Rg. Cain et al., Force calibration in lateral force microscopy, J COLL I SC, 227(1), 2000, pp. 55-65
Citations number
35
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF COLLOID AND INTERFACE SCIENCE
ISSN journal
00219797 → ACNP
Volume
227
Issue
1
Year of publication
2000
Pages
55 - 65
Database
ISI
SICI code
0021-9797(20000701)227:1<55:FCILFM>2.0.ZU;2-U
Abstract
An analysis of the contact mechanics and the forces of interaction in later al force microscopy measurements is presented, This analysis allows for a n ew method of interpretation of the frictional forces, the lateral contact s tiffness, and the contact shear strength. The technique was developed for t he interpretation of frictional data obtained with colloidal probes, althou gh results are presented which illustrate its ability to interpret measurem ents recorded with both colloidal probes and standard atomic force microsco py tips. The technique is found to compensate for the variations in the con tact geometry, giving repeatable results for probes of different sizes. A c ritical review of other techniques which have been employed to interpret th e frictional force in lateral force microscopy is also presented. (C) 2000 Academic Press.