The partial pressures, p(Cd) and p(Zn), over Cd1-xZnxTe (CZT) and Cd1-xZnx,
melts were estimated based on known thermodynamic data and the partial pre
ssures, p(Cd) and p(Zn), over Cd0.86Zn0.14 alloy melt at a temperature of a
bout 980 degrees C could be equilibrium with those over Cd0.8Zn0.2Te melt a
t a melting temperature of 1162 degrees C. The Cd0.8Zn0.2Te crystal growth
from the melt under controlled constituent partial pressures, provided by C
d0.86Zn0.14 alloy instead of only Cd source was carried out in this work. T
he best result for the resistivity, which has reached up to about 10(10) Om
ega cm, has been obtained under the equilibrium partial pressures estimated
by thermodynamic relationships. The axial variation in Zn concentration, w
hich has been obviously improved due to the Zn replenishment from the reser
voir during the whole growth procedure, is within about 4%. EPD on the aver
age was about 2 x 10(5) and 4 x 10(4)cm(-2) at the middle of the bulk. IR t
ransmissivity in the range of 2 to 42 mu m is larger than 60%. In addition,
the relationship between resistivities and conducting types of the crystal
and different controlled pressures is also discussed. (C) 2000 Elsevier Sc
ience B.V. All rights reserved.