Vi. Kozlovsky et al., MBE growth and characterization of ZnTe epilayers and ZnCdTe/ZnTe structures on GaAs(100) and ZnTe(100) substrates, J CRYST GR, 214, 2000, pp. 35-39
Deposition of an amorphous ZnTe seed layer with a thickness of 10 nm follow
ed by its solid-phase crystallization was done before the beginning of mole
cular beam epitaxy of ZnTe layers on GaAs(1 0 0) substrates. RHEED patterns
have proved that a creation of three-dimensional formations is avoided, an
d two-dimensional growth occurs during the early stage of epitaxy. Cathodol
uminescence (CL) and X-ray measurements have evidenced a higher quality of
ZnTe layers grown with an amorphous ZnTe seed layer. ZnTe substrates made o
f ZnTe crystals grown from vapor phase have been used for the epitaxy of Zn
Te layers and ZnCdTe/ZnTe structures also. CL comparison of homo- and heter
oepitaxial layers and structures shows the superiority of epilayers and str
uctures grown on ZnTe(1 0 0) substrates. (C) 2000 Elsevier Science B.V. All
rights reserved.