Two-dimensional growth of ZnO films on sapphire(0001) with buffer layers

Citation
Yf. Chen et al., Two-dimensional growth of ZnO films on sapphire(0001) with buffer layers, J CRYST GR, 214, 2000, pp. 87-91
Citations number
8
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
214
Year of publication
2000
Pages
87 - 91
Database
ISI
SICI code
0022-0248(200006)214:<87:TGOZFO>2.0.ZU;2-B
Abstract
Plasma-assisted molecular beam epitaxy (P-MBE) of ZnO films on Al2O3(0 0 0 1) substrates is reported. By introducing a thin buffer layer of MgO, surfa ce morphology can be greatly improved at the initial growth stage, which le ads to an atomically flat ZnO surface with (3 x 3) reconstruction. During t he consequent ZnO film deposition, RHEED intensity oscillations longer than 50 periods can be observed, which evidences the two-dimensional epitaxial growth. Morphological, structural, and optical investigations indicate that by using the MgO buffer layer a great improvement, of surface flatness and crystal quality is achieved for the ZnO films grown on Al2O3(0 0 0 1) subs trates by P-MBE. (C) 2000 Elsevier Science B.V. All rights reserved.