The interface properties between well-polished MCT and ZnS layers deposited
by three different physical techniques, and DLC prepared by RFPCVD, have b
een investigated by AES, IRTS, etc. ZnS and DLC films can prevent the outwa
rd diffusion of the components in MCT. However, Zn and S in the ZnS layer t
end to diffuse into the MCT, especially, the S diffuses deeper in the case
of EBV, and O is detected especially after PLD, but C in the DLC layer diff
uses only slightly into the MCT. In particular, the IR transmission of the
MCT with deposited DLC is obviously raised, and higher than that of the MCT
with deposited ZnS at least in the range of 7.1-7.5 mu m. (C) 2000 Elsevie
r Science B.V. All rights reserved.