Photoluminescence core-level excitation of CdSe quantum dot structures

We propose a new method of photoluminescence (PL) measurements, that is, ex citing core levels using synchrotron radiation. This method has been applie d to characterize CdSe quantum dot (QD) structures in this study. PL spectr a of the CdSe QD sample under Zn 2p core-level excitation are slightly diff erent from conventional FL. PL core-level excitation (PLCLE) spectra have s harp Zn 2p(3/2) and Zn 2p(1/2) absorption edges and core-exciton peaks for CdSe QDs. Moreover, the PLCLE spectra reveal interfacial states between ZnS e barrier layers and CdSe QDs. This result indicates that PLCLE is useful a s a local probe for the thin films and semiconductor nanostructures. (C) 20 00 Elsevier Science B.V. All rights reserved.