Raman characterization of CdTe/CdS-"core-shell"-clusters in colloids and films

Citation
B. Schreder et al., Raman characterization of CdTe/CdS-"core-shell"-clusters in colloids and films, J CRYST GR, 214, 2000, pp. 782-786
Citations number
14
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
214
Year of publication
2000
Pages
782 - 786
Database
ISI
SICI code
0022-0248(200006)214:<782:RCOCIC>2.0.ZU;2-6
Abstract
We present the Raman spectroscopic characterization of thermally sintered C dTe/CdS-colloids in thin films. From the spectral data one can conclude tha t the thermal sintering of the CdTe/CdS-films between 100 degrees C and 200 degrees C initiates the CdTe cluster growth. Sintering temperatures of 300 -400 degrees C lead to a release of the Tributylphosyhin- (TBP) capping lig ands and to the formation of bare CdS- and CdTe nanocrystals. Above 400 deg rees C, the CdTe part of the nanostructures sublimates, leaving behind near ly pure CdS nanocrystallites. (C) 2000 Elsevier Science B.V. All rights res erved.