An STM study of the Pr-Si(111)-(7 x 7) interface reveals a much more h
eterogeneous growth morphology than is suggested by diffraction techni
ques and spectroscopies which average over the surface. Deposition of
1 ML followed by annealing at 650 degrees C gives the most orderly gro
wth, but this falls short of 2D epitaxy. At high temperatures (>1000 d
egrees C), the small amount of rare earth remaining on the surface sta
bilises some novel Si(111) surface reconstructions. (C) 1997 Elsevier
Science B.V.