Growth and characterisation of bulk Zn1-xBexSe, Zn1-x-yMgxBeySe and Zn1-xBexTe crystals

Citation
F. Firszt et al., Growth and characterisation of bulk Zn1-xBexSe, Zn1-x-yMgxBeySe and Zn1-xBexTe crystals, J CRYST GR, 214, 2000, pp. 880-884
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
214
Year of publication
2000
Pages
880 - 884
Database
ISI
SICI code
0022-0248(200006)214:<880:GACOBZ>2.0.ZU;2-C
Abstract
In this paper we report an extension of our earlier results for Zn1-xMgxSe and low-Be Zn1-xBexSe to related ternary (high-Be Zn1-xBexSe and Zn1-xBexTe ) and quaternary (Zn1-x-yMgxBeySe) alloys. ii dependence of defect structur e on crystal composition, growth and thermal treatment is observed. X-ray d iffraction was used for phase analysis and determination of lattice paramet ers. High-resolution transmission electron microscopy was used to compare k ind and density of defect. Among the studied crystals, the lowest defect de nsity was found for Zn1-x-yMgxBeySe. (C) 2000 Elsevier Science B.V. All rig hts reserved.