Characterization of electro-optic shielding effect in bulk CdTe : In crystals

We have characterized the role of electro-optic field shielding effect in b ulk CdTe:In rods at 1550 nm. Different temperatures, modulating frequencies and probe beam power have been tested. Experimental results agree with a d ielectric relaxation explanation, when taking into account the high injecti on regime and the contribution of collection of photo-generated free excess carriers at the contacts. The lowering in electro-optic yield can be minim ized by a suitable reduction in operating temperature and sample dimensions , having defined the optical power of the signal to be processed. (C) 2000 Elsevier Science B.V. All rights reserved.